Scanning Tunneling Microscopy in (Bi, Sb)2(Te, Se, S)3 Chalcogenide Thermoelectrics
Scanning Tunneling Microscopy in (Bi, Sb)2(Te, Se, S)3 Chalcogenide Thermoelectrics
About this item
Full title
Scanning Tunneling Microscopy in (Bi, Sb)2(Te, Se, S)3 Chalcogenide Thermoelectrics
Author / Creator
Publisher
Moscow: Pleiades Publishing
Journal title
Semiconductors (Woodbury, N.Y.), 2022-03, Vol.56 (3), p.195-200
Language
English
Formats
Publication information
Publisher
Moscow: Pleiades Publishing
Subjects
More information
Scope and Contents
Contents
The morphology of the (0001) interlayer surface has been investigated by scanning tunneling microscopy in
n
-Bi
1.6
Sb
0.4
Te
2.94
Se
0.06
,
n
-Bi
1.8
Sb
0.2
Te
2.82
Se
0.09
S
0.09
,
p
-Bi
0.8
Sb
1.2
Te
2.91
Se
0.09,
and
p
-Bi
0.7
Sb
1.3
Alternative Titles
Full title
Scanning Tunneling Microscopy in (Bi, Sb)2(Te, Se, S)3 Chalcogenide Thermoelectrics
Authors, Artists and Contributors
Author / Creator
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_proquest_journals_2677630144
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2677630144
Other Identifiers
ISSN
1063-7826
E-ISSN
1090-6479
DOI
10.1134/S1063782622020105
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