STEM-EELS Analysis of Niobium Oxide Multilayer Films for High Temperature Memristor Devices
STEM-EELS Analysis of Niobium Oxide Multilayer Films for High Temperature Memristor Devices
About this item
Full title
STEM-EELS Analysis of Niobium Oxide Multilayer Films for High Temperature Memristor Devices
Author / Creator
Publisher
New York, USA: Cambridge University Press
Journal title
Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.2054-2056
Language
English
Formats
Publication information
Publisher
New York, USA: Cambridge University Press
Subjects
More information
Alternative Titles
Full title
STEM-EELS Analysis of Niobium Oxide Multilayer Films for High Temperature Memristor Devices
Authors, Artists and Contributors
Author / Creator
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_proquest_journals_2692529269
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2692529269
Other Identifiers
ISSN
1431-9276
E-ISSN
1435-8115
DOI
10.1017/S1431927622007954
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