Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth p...
Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary-ion mass spectrometry (SIMS)
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Berlin: Springer Nature B.V
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Language
English
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Berlin: Springer Nature B.V
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Secondary-ion mass spectrometry is frequently used for concentration–depth profiling of macroscopic samples, but it is certainly not a common analytical technique for the analysis of sub-micrometer-size particles. This is because of the additional ion-bombardment-induced artifacts which can occur when a three-dimensional microvolume is sputtered, i...
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Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary-ion mass spectrometry (SIMS)
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TN_cdi_proquest_journals_2705542915
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2705542915
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ISSN
1618-2642
E-ISSN
1618-2650
DOI
10.1007/s002160100880
