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Resolving the Unusual Gate Leakage Currents of Thin-Film Transistors with Single-Walled Carbon-Nanot...

Resolving the Unusual Gate Leakage Currents of Thin-Film Transistors with Single-Walled Carbon-Nanot...

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2739419333

Resolving the Unusual Gate Leakage Currents of Thin-Film Transistors with Single-Walled Carbon-Nanotube-Based Active Layers

About this item

Full title

Resolving the Unusual Gate Leakage Currents of Thin-Film Transistors with Single-Walled Carbon-Nanotube-Based Active Layers

Publisher

Basel: MDPI AG

Journal title

Electronics (Basel), 2022-11, Vol.11 (22), p.3719

Language

English

Formats

Publication information

Publisher

Basel: MDPI AG

More information

Scope and Contents

Contents

Solution-processed single-walled carbon nanotube (SWCNT) thin-film transistors (TFTs) in the research stage often have large active areas. This results in unusual gate leakage currents with high magnitudes that vary with applied voltages. In this paper, we report an improved structure for solution-processed SWCNT-based TFTs. The unusual gate leakag...

Alternative Titles

Full title

Resolving the Unusual Gate Leakage Currents of Thin-Film Transistors with Single-Walled Carbon-Nanotube-Based Active Layers

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_proquest_journals_2739419333

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2739419333

Other Identifiers

ISSN

2079-9292

E-ISSN

2079-9292

DOI

10.3390/electronics11223719

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