Single-event upset prediction in static random access memory cell account for parameter variations
Single-event upset prediction in static random access memory cell account for parameter variations
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Publisher
Beijing: Science China Press
Journal title
Language
English
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Publisher
Beijing: Science China Press
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Alternative Titles
Full title
Single-event upset prediction in static random access memory cell account for parameter variations
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Record Identifier
TN_cdi_proquest_journals_2918561187
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2918561187
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ISSN
1674-733X
E-ISSN
1869-1919
DOI
10.1007/s11432-018-9561-9