Automatic test-bench for SiC power devices using LabVIEW
Automatic test-bench for SiC power devices using LabVIEW
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Publisher
Bratislava: Sciendo
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Language
English
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Publisher
Bratislava: Sciendo
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Scope and Contents
Contents
This paper is devoted to the improvement existing models of electronics devices, which are used in powers electronics as switching devices, and investigate a LabVIEW-based automatic test-bench for Silicon carbide (SiC) power devices. In recent years, power electronic devices are required to be capable handle with higher voltage, leads to developmen...
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Full title
Automatic test-bench for SiC power devices using LabVIEW
Authors, Artists and Contributors
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Record Identifier
TN_cdi_proquest_journals_3033044054
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_3033044054
Other Identifiers
ISSN
1339-309X,1335-3632
E-ISSN
1339-309X
DOI
10.2478/jee-2024-0011
