A Monte Carlo study of K escape phenomena of X-ray spectra in CdTe and Gd2O2S detectors
A Monte Carlo study of K escape phenomena of X-ray spectra in CdTe and Gd2O2S detectors
About this item
Publication information
Publisher
Bristol: IOP Publishing
Subjects
More information
Scope and Contents
Contents
Detectors can be categorized as energy-integrated detectors (EID) and photon-counting detectors (PCD). Both of them show K x-ray escape effects, leading to potential inaccuracies in spectral data. This paper focuses on investigation of the detector’s K x-ray escape effects on spectra. Geant4-based Monte Carlo simulations were initially validated ag...
Alternative Titles
Full title
A Monte Carlo study of K escape phenomena of X-ray spectra in CdTe and Gd2O2S detectors
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_proquest_journals_3082829745
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_3082829745
Other Identifiers
ISSN
1742-6588
E-ISSN
1742-6596
DOI
10.1088/1742-6596/2793/1/012020
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