Defect detection and size classification in CdTe samples in 3D
Defect detection and size classification in CdTe samples in 3D
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Ithaca: Cornell University Library, arXiv.org
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English
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Ithaca: Cornell University Library, arXiv.org
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Defects in semiconductor crystals can have significant detrimental effects on their performance as radiation detectors. Defects cause charge trapping and recombination, leading to lower signal amplitudes and poor energy resolution. We have designed and built a modular 3D scanner for analyzing these defects in semiconductor samples using commercial...
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Defect detection and size classification in CdTe samples in 3D
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TN_cdi_proquest_journals_3111342819
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_3111342819
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2331-8422
