Scanning ultrafast electron microscopy
Scanning ultrafast electron microscopy
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United States: National Academy of Sciences
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Language
English
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Publisher
United States: National Academy of Sciences
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Progress has been made in the development of four-dimensional ultrafast electron microscopy, which enables space-time imaging of structural dynamics in the condensed phase. In ultrafast electron microscopy, the electrons are accelerated, typically to 200 keV, and the microscope operates in the transmission mode. Here, we report the development of s...
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Full title
Scanning ultrafast electron microscopy
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TN_cdi_proquest_journals_747958024
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_747958024
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ISSN
0027-8424
E-ISSN
1091-6490
DOI
10.1073/pnas.1009321107
