ISTFA 2014 Contactless fault isolation user's group
ISTFA 2014 Contactless fault isolation user's group
About this item
Full title
ISTFA 2014 Contactless fault isolation user's group
Author / Creator
Publisher
ASM International
Journal title
Electronic device failure analysis, 2015-02, Vol.17 (1), p.33-33
Language
English
Publication information
Publisher
ASM International
Subjects
More information
Scope and Contents
Contents
Optical probing techniques continue to be critical in the failure analysis (FA), fault isolation, and product development space. As the industry moves into the 14/16/22 nm geometries, many wonder if the current techniques will generate the results needed to improve yield, debug, characterize, and move products to market. To that end, some of the to...
Alternative Titles
Full title
ISTFA 2014 Contactless fault isolation user's group
Authors, Artists and Contributors
Author / Creator
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_proquest_miscellaneous_1677949482
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_miscellaneous_1677949482
Other Identifiers
ISSN
1537-0755
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