Study on effects of scan parameters on the image quality and tip wear in AFM tapping mode
Study on effects of scan parameters on the image quality and tip wear in AFM tapping mode
About this item
Full title
Author / Creator
Xue, Bo , Yan, Yongda , Hu, Zhenjiang and Zhao, Xuesen
Publisher
England: Blackwell Publishing Ltd
Journal title
Language
English
Formats
Publication information
Publisher
England: Blackwell Publishing Ltd
Subjects
More information
Scope and Contents
Contents
Summary
Due to the tip‐sample interaction which is the measurement principle of Atomic Force Microscope (AFM), tip wear constantly occurs during scanning. The blunt tip caused by the wear process makes more tip geometry information involved in the image, and correspondingly it increases the measurement error. In the present study, the scan param...
Alternative Titles
Full title
Study on effects of scan parameters on the image quality and tip wear in AFM tapping mode
Authors, Artists and Contributors
Author / Creator
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_proquest_miscellaneous_1680187858
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_miscellaneous_1680187858
Other Identifiers
ISSN
0161-0457
E-ISSN
1932-8745
DOI
10.1002/sca.21099
