Multifractal Analysis for Soft Fault Feature Extraction of Nonlinear Analog Circuits
Multifractal Analysis for Soft Fault Feature Extraction of Nonlinear Analog Circuits
About this item
Full title
Author / Creator
Wu, Qiong , Lin, Haijun , Zhao, Hong and Lu, Xinmiao
Publisher
Cairo, Egypt: Hindawi Publishing Corporation
Journal title
Language
English
Formats
Publication information
Publisher
Cairo, Egypt: Hindawi Publishing Corporation
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More information
Scope and Contents
Contents
Aiming at the nonstationarity and nonlinearity of soft fault signals of nonlinear analog circuits, the use of multifractal detrended fluctuation analysis can effectively reveal the dynamic behavior hidden in multiscale nonstationary signals. This paper adopts a new method that uses multifractal detrended fluctuation analysis to calculate the multif...
Alternative Titles
Full title
Multifractal Analysis for Soft Fault Feature Extraction of Nonlinear Analog Circuits
Authors, Artists and Contributors
Author / Creator
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Primary Identifiers
Record Identifier
TN_cdi_proquest_miscellaneous_1816056956
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_miscellaneous_1816056956
Other Identifiers
ISSN
1024-123X
E-ISSN
1563-5147
DOI
10.1155/2016/7305702
