Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Ele...
Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi Diffraction
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New York, USA: Cambridge University Press
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English
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New York, USA: Cambridge University Press
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Two advanced, automated crystal orientation mapping techniques suited for nanocrystalline materials—precession electron diffraction (PED) in transmission electron microscopy (TEM) and on-axis transmission Kikuchi diffraction (TKD) in scanning electron microscopy (SEM)—are evaluated by comparing the orientation maps obtained from the identical locat...
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Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi Diffraction
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TN_cdi_proquest_miscellaneous_2487159795
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_miscellaneous_2487159795
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ISSN
1431-9276
E-ISSN
1435-8115
DOI
10.1017/S1431927621000027
