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On-Line Fault Resilience Through Gracefully Degradable ASICs

On-Line Fault Resilience Through Gracefully Degradable ASICs

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_miscellaneous_26669910

On-Line Fault Resilience Through Gracefully Degradable ASICs

About this item

Full title

On-Line Fault Resilience Through Gracefully Degradable ASICs

Author / Creator

Publisher

Boston: Springer Nature B.V

Journal title

Journal of electronic testing, 1998-02, Vol.12 (1-2), p.145-151

Language

English

Formats

Publication information

Publisher

Boston: Springer Nature B.V

More information

Scope and Contents

Contents

We present two novel reconfiguration schemes, L/U reconfiguration and its generalization, band reconfiguration, to achieve graceful degradation for general microarchitecture datapaths. Upon detection of a datapath fault, hardware and algorithmic reconfigurations are performed dynamically through operation rescheduling and hardware rebinding. Instea...

Alternative Titles

Full title

On-Line Fault Resilience Through Gracefully Degradable ASICs

Authors, Artists and Contributors

Author / Creator

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_proquest_miscellaneous_26669910

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_miscellaneous_26669910

Other Identifiers

ISSN

0923-8174

E-ISSN

1573-0727

DOI

10.1023/A:1008298226600

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