Low Cost On-Line Testing Strategy for RF Circuits
Low Cost On-Line Testing Strategy for RF Circuits
About this item
Full title
Author / Creator
Publisher
Boston: Springer Nature B.V
Journal title
Language
English
Formats
Publication information
Publisher
Boston: Springer Nature B.V
Subjects
More information
Scope and Contents
Contents
Issue Title: Special Issue on On-Line-Testing and Fault Tolerance This work proposes the use of a simple 1-bit digitizer as an analog block observer, in order to enable the implementation of on-line test strategies for RF analog circuits in the System-on-Chip environment. The main advantages of using a simple digitizer for RF circuits are related t...
Alternative Titles
Full title
Low Cost On-Line Testing Strategy for RF Circuits
Authors, Artists and Contributors
Author / Creator
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_proquest_miscellaneous_28969966
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_miscellaneous_28969966
Other Identifiers
ISSN
0923-8174
E-ISSN
1573-0727
DOI
10.1007/s10836-005-1151-y
