Method for visualizing detailed profiles of synchrotron X-ray beams using diamond-thin films and sil...
Method for visualizing detailed profiles of synchrotron X-ray beams using diamond-thin films and silicon drift detectors
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Publisher
United States
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Language
English
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Publisher
United States
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Contents
Contamination from nearby bending magnet radiation hinders precise and accurate determination of the true beam center of undulator radiation. To solve this problem, a semi-nondestructive method was developed to visualize the detailed profile of a synchrotron radiation beam by using a thin diamond film as a scatterer. As the beam passed through the...
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Full title
Method for visualizing detailed profiles of synchrotron X-ray beams using diamond-thin films and silicon drift detectors
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TN_cdi_proquest_miscellaneous_3193711500
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_miscellaneous_3193711500
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ISSN
1600-5775
E-ISSN
1600-5775
DOI
10.1107/S1600577525002838