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Investigation of NiOx-based contacts on p-GaN

Investigation of NiOx-based contacts on p-GaN

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_miscellaneous_35464561

Investigation of NiOx-based contacts on p-GaN

About this item

Full title

Investigation of NiOx-based contacts on p-GaN

Publisher

Boston: Springer US

Journal title

Journal of materials science. Materials in electronics, 2008-09, Vol.19 (8-9), p.855-862

Language

English

Formats

Publication information

Publisher

Boston: Springer US

More information

Scope and Contents

Contents

In this study we investigated the effect of a NiO
x
layer on the electrical properties of oxidized Au/NiO
x
/p-GaN ohmic contacts. Au/NiO
x
layers with a small concentration of oxygen in NiO
x
were deposited on p-GaN by reactive DC magnetron sputtering and annealed in a mixture of O
2
 + N
2
, and in N
2
....

Alternative Titles

Full title

Investigation of NiOx-based contacts on p-GaN

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_proquest_miscellaneous_35464561

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_miscellaneous_35464561

Other Identifiers

ISSN

0957-4522

E-ISSN

1573-482X

DOI

10.1007/s10854-007-9520-1

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