Correlation of Multiplicity and Chemistry in Al x Ga 1− x N Heterostructure via Atom Probe Tomograph...
Correlation of Multiplicity and Chemistry in Al x Ga 1− x N Heterostructure via Atom Probe Tomography
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Publisher
United States
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Language
English
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United States
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Contents
In this work, the correlation between composition and relative evaporation field was investigated by tracking the statistics of multi-hit detector events in atom probe tomography (APT). This approach is applied systematically to a GaN-based nitride heterostructure with five Al
x
Ga
1−
x
N layers of varying Al composition. The relativ...
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Full title
Correlation of Multiplicity and Chemistry in Al x Ga 1− x N Heterostructure via Atom Probe Tomography
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TN_cdi_pubmed_primary_32014067
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_pubmed_primary_32014067
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ISSN
1431-9276
E-ISSN
1435-8115
DOI
10.1017/S1431927619015277
