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Optical thermometry based on level anticrossing in silicon carbide

Optical thermometry based on level anticrossing in silicon carbide

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_5022017

Optical thermometry based on level anticrossing in silicon carbide

About this item

Full title

Optical thermometry based on level anticrossing in silicon carbide

Publisher

London: Nature Publishing Group UK

Journal title

Scientific reports, 2016-09, Vol.6 (1), p.33301, Article 33301

Language

English

Formats

Publication information

Publisher

London: Nature Publishing Group UK

More information

Scope and Contents

Contents

We report a giant thermal shift of 2.1 MHz/K related to the excited-state zero-field splitting in the silicon vacancy centers in 4H silicon carbide. It is obtained from the indirect observation of the optically detected magnetic resonance in the excited state using the ground state as an ancilla. Alternatively, relative variations of the zero-field...

Alternative Titles

Full title

Optical thermometry based on level anticrossing in silicon carbide

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_5022017

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_5022017

Other Identifiers

ISSN

2045-2322

E-ISSN

2045-2322

DOI

10.1038/srep33301

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