Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning...
Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images
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Publisher
Cham: Springer International Publishing
Journal title
Language
English
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Publisher
Cham: Springer International Publishing
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Scope and Contents
Contents
Serial block-face scanning electron microscopy (SBEM) is quickly becoming an important imaging tool to explore three-dimensional biological structure across spatial scales. At probe-beam-electron energies of 2.0 keV or lower, the axial resolution should improve, because there is less primary electron penetration into the block face. More specifical...
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Full title
Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images
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Record Identifier
TN_cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_5025511
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_5025511
Other Identifiers
ISSN
2198-0926
E-ISSN
2198-0926
DOI
10.1186/s40679-016-0025-y
