Two different phase-change origins with chemical- and structural-phase-changes in C doped (1.5 wt.%)...
Two different phase-change origins with chemical- and structural-phase-changes in C doped (1.5 wt.%) In3Sb1Te2
About this item
Full title
Author / Creator
Lee, Y. M. , Lee, S. Y. , Sasaki, T. , Kim, K. , Ahn, D. and Jung, M.-C.
Publisher
London: Nature Publishing Group UK
Journal title
Language
English
Formats
Publication information
Publisher
London: Nature Publishing Group UK
Subjects
More information
Scope and Contents
Contents
We fabricated C-doped (1.5 wt.%) In
3
Sb
1
Te
2
(CIST) thin films with amorphous phase (
a
-CIST) using a sputter method. Two electrical-phase-changes at 250 and 275 °C were observed in the sheet resistance measurement. In order to understand the origin of these electrical-phase-changes, all samples were characterized by XRD...
Alternative Titles
Full title
Two different phase-change origins with chemical- and structural-phase-changes in C doped (1.5 wt.%) In3Sb1Te2
Authors, Artists and Contributors
Author / Creator
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_5144130
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_5144130
Other Identifiers
ISSN
2045-2322
E-ISSN
2045-2322
DOI
10.1038/srep38663
