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Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imagi...

Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imagi...

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_swepub_primary_oai_DiVA_org_kth_122329

Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging

About this item

Full title

Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging

Publisher

London: Nature Publishing Group UK

Journal title

Scientific reports, 2013-04, Vol.3 (1), p.1633-1633, Article 1633

Language

English

Formats

Publication information

Publisher

London: Nature Publishing Group UK

More information

Scope and Contents

Contents

The emergence of hard X-ray free electron lasers (XFELs) enables new insights into many fields of science. These new sources provide short, highly intense and coherent X-ray pulses. In a variety of scientific applications these pulses need to be strongly focused. In this article, we demonstrate focusing of hard X-ray FEL pulses to 125 nm using refr...

Alternative Titles

Full title

Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_swepub_primary_oai_DiVA_org_kth_122329

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_swepub_primary_oai_DiVA_org_kth_122329

Other Identifiers

ISSN

2045-2322

E-ISSN

2045-2322

DOI

10.1038/srep01633