A Simple Transmission Electron Microscopy Method for Fast Thickness Characterization of Suspended Gr...
A Simple Transmission Electron Microscopy Method for Fast Thickness Characterization of Suspended Graphene and Graphite Flakes
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Publisher
New York, USA: Cambridge University Press
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Language
English
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Publisher
New York, USA: Cambridge University Press
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We present a simple, fast method for thickness characterization of suspended graphene/graphite flakes that is based on transmission electron microscopy (TEM). We derive an analytical expression for the intensity of the transmitted electron beam I0(t), as a function of the specimen thickness t (t<<λ; where λ is the absorption constant for graphite)....
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Full title
A Simple Transmission Electron Microscopy Method for Fast Thickness Characterization of Suspended Graphene and Graphite Flakes
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TN_cdi_swepub_primary_oai_DiVA_org_uu_299522
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_swepub_primary_oai_DiVA_org_uu_299522
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ISSN
1431-9276,1435-8115
E-ISSN
1435-8115
DOI
10.1017/S143192761501569X
