Parity and the risk of incident dementia: a COSMIC study
Parity and the risk of incident dementia: a COSMIC study
About this item
Full title
Author / Creator
for Cohort Studies of Memory in an International Consortium (COSMIC) , Bae, J. B. , Lipnicki, D. M. , Han, J. W. , Sachdev, P. S. , Kim, T. H. , Kwak, K. P. , Kim, B. J. , Kim, S. G. , Kim, J. L. , Moon, S. W. , Park, J. H. , Ryu, S.-H. , Youn, J. C. , Lee, D. Y. , Lee, D. W. , Lee, S. B. , Lee, J. J. , Jhoo, J. H. , Skoog, I. , Najar, J. , Sterner, T. R. , Scarmeas, N. , Yannakoulia, M. , Dardiotis, E. , Riedel-Heller, S. , Roehr, S. , Pabst, A. , Ding, D. , Zhao, Q. , Liang, X. , Lobo, A. , De-la-Cámara, C. , Lobo, E. and Kim, K. W.
Publisher
England: Cambridge University Press
Journal title
Language
English
Formats
Publication information
Publisher
England: Cambridge University Press
Subjects
More information
Scope and Contents
Contents
To investigate the association between parity and the risk of incident dementia in women.
We pooled baseline and follow-up data for community-dwelling women aged 60 or older from six population-based, prospective cohort studies from four European and two Asian countries. We investigated the association between parity and incident dementia using...
Alternative Titles
Full title
Parity and the risk of incident dementia: a COSMIC study
Authors, Artists and Contributors
Author / Creator
Bae, J. B.
Lipnicki, D. M.
Han, J. W.
Sachdev, P. S.
Kim, T. H.
Kwak, K. P.
Kim, B. J.
Kim, S. G.
Kim, J. L.
Moon, S. W.
Park, J. H.
Ryu, S.-H.
Youn, J. C.
Lee, D. Y.
Lee, D. W.
Lee, S. B.
Lee, J. J.
Jhoo, J. H.
Skoog, I.
Najar, J.
Sterner, T. R.
Scarmeas, N.
Yannakoulia, M.
Dardiotis, E.
Riedel-Heller, S.
Roehr, S.
Pabst, A.
Ding, D.
Zhao, Q.
Liang, X.
Lobo, A.
De-la-Cámara, C.
Lobo, E.
Kim, K. W.
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_swepub_primary_oai_gup_ub_gu_se_302110
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_swepub_primary_oai_gup_ub_gu_se_302110
Other Identifiers
ISSN
2045-7960,2045-7979
E-ISSN
2045-7979
DOI
10.1017/S2045796020000876
