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Books
Ophthalmic microsurgery / Workshop on Microsurgery, Singapore, May 9-14, 1977 ; Volume editors, S. S. Ratnam ... [et al.].
Author / Creator:Workshop on Microsurgery (1977 : Singapore)
Publisher:Basel ; New York : S. Karger, 1978.
Date:1978.
Call Numbers:617.71/1
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ArticlesPeer ReviewedFull Text
Recording and Using 4D-STEM Datasets in Materials Science
Author / Creator:Ophus, Colin ; Ercius, Peter ; Sarahan, Michael ; Czarnik, Cory ; Ciston, Jim
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.62-63
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ArticlesPeer ReviewedFull Text
Off-Axial Aberration Correction using a B-COR for Lorentz and HREM Modes
Author / Creator:Snoeck, Etienne ; Houdellier, Florent ; Taniguch, Yoshifumi ; Masseboeuf, Aurelien ; Gatel, Christophe ; Nicolai, Julien ; Hytch, Martin
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.932-933
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ArticlesPeer ReviewedFull Text
Interactive Analysis of Terabyte-sized SEM-EDS Hyperspectral Images
Author / Creator:Vandecreme, Antoine ; Bajcsy, Peter ; Ritchie, Nicholas W.M. ; Scott, John Henry J.
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.654-655
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ArticlesPeer ReviewedFull Text
How to Process Zillions of Spectra from Spectral Imaging Datasets? From Phase-Mapping to Bulk-Chemistry on Micron- to Centimeter Scale Using PARC
Author / Creator:van Hoek, Corrie
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.660-661
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ArticlesPeer ReviewedFull Text
Identification of New Lithic Clasts in Lunar Breccia 14305 by micro-CT and micro-XRF analysis
Author / Creator:Zeigler, Ryan A. ; Carpenter, Paul K. ; Jolliff, Bradley L.
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.636-637
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ArticlesPeer ReviewedFull Text
X-Ray Microanalysis with High Spatial Resolution and High Counts Rate with a State of the Art Field Emission Scanning Electron Microscope
Author / Creator:Gauvin, Raynald ; Brodusch, Nicolas ; Demers, Hendrix ; Woo, Patrick
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.650-651
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ArticlesPeer ReviewedFull Text
X-Ray Mapping Investigations of Salt Migration in Seeds through use of Window and Windowless Silicon Drift Detectors
Author / Creator:Wuhrer, Richard ; Guja, Lydia ; Merritt, David ; Moran, Ken
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.634-635
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ArticlesPeer ReviewedFull Text
X-ray Mapping and Chemical Phase Mapping with an Amptek SDD
Author / Creator:Moran, L. ; Moran, K. ; Wuhrer, R.
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.678-679
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ArticlesPeer ReviewedFull Text
Support Vector Machines for Classification and Quantitative Analysis
Author / Creator:Davis, Jeffrey M.
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.656-657
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ArticlesPeer ReviewedFull Text
X-ray Quantitative Microanalysis Maps across Interfaces of a Cu-Al Roll Bonded Laminate with an Annular Silicon Drift Detector
Author / Creator:Demers, Hendrix ; Brodusch, Nicolas ; Wuhrer, Richard ; Moran, Ken ; Woo, Patrick ; Gauvin, Raynald
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.676-677
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ArticlesPeer ReviewedFull Text
Mitigating Thermal Beam Damage with Metallic Coats in Low Voltage FEG-EPMA of Geological Materials
Author / Creator:Kearns, Stuart ; Buse, Ben ; Wade, Jon
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.740-741
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ArticlesPeer ReviewedFull Text
The Use of a High-Resolution, High-Contrast X-ray Microscope to Probe the Internal Structure of Low Z Materials
Author / Creator:Ferrara, Joseph D. ; Araki, Yoichi ; Hamada, Kensaku ; Omote, Kazuhiko ; Takeda, Yoshihiro
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.674-675
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ArticlesPeer ReviewedFull Text
Characterization of Rare Earth Element Ores with High Spatial Resolution Scanning Electron Microscopy
Author / Creator:Teng, C. ; Demers, H. ; Brodusch, N. ; Waters, K.E. ; Gauvin, R.
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.648-649
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ArticlesPeer ReviewedFull Text
Investigation of Multiple, Large Area EDS Detectors on an SEM Capable of Various Mounting Geometries for Optimal EDS Analysis
Author / Creator:Edwards, D. ; Rowlands, N. ; Guarrera, D. ; Erdman, N. ; Robertson, V. ; McLaughlin, R.
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.646-647
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ArticlesPeer ReviewedFull Text
Fluorescence Micro-tomography of Frozen-hydrated Whole Cells using the Bionanoprobe
Author / Creator:Chen, S. ; Flachenecker, C. ; Paunesku, T. ; Yuan, Y. ; Liu, W. ; Deng, J. ; Jin, Q. ; Wak, R. ; Lai, B. ; Hornberger, B. ; Roehrig, C. ; Von Osinski, J. ; Bolbat, M. ; Maser, J. ; Shu, D. ; Gleber, S. ; Finney, L. ; Brister, K. ; Jacobsen, C. ; Woloschak, G. ; Vogt, S.
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.668-669
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ArticlesPeer ReviewedFull Text
Multidimensional Data Sets - Presentation, Evaluation and Extraction
Author / Creator:Haschke, M. ; Waldschläger, U. ; Tagle, R. ; Rossek, U.
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.642-643
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ArticlesPeer ReviewedFull Text
Large Area EDS Mapping: Automated Collection of High Resolution Elemental Maps For Post Acquisition Analysis
Author / Creator:Burgess, S. ; Hyde, A. ; McCarthy, C. ; Meeks, Nigel
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.640-641
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ArticlesPeer ReviewedFull Text
Mineral Analyses & Implications on the Dispersion of Bismuth in the Supergene Environment of Eastern Australia
Author / Creator:Murphy, T ; Roper, A. J. ; Hager, S. ; Wuhrer, R. ; Leverett, P. ; Williams, P. A.
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.644-645
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ArticlesPeer ReviewedFull Text
Need for Large-Area EDS Detectors for Imaging Nanoparticles in a SEM Operating in Transmission Mode
Author / Creator:Rades, Steffi ; Salge, Tobias ; Schmidt, Roland ; Hodoroaba, Vasile-Dan
Publisher:New York, USA: Cambridge University Press
Journal title:Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.662-663
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Ophthalmic microsurgery / Workshop on Microsurgery, Singapore, May 9-14, 1977 ; Volume editors, S. S. Ratnam ... [et al.].

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Recording and Using 4D-STEM Datasets in Materials Science

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Off-Axial Aberration Correction using a B-COR for Lorentz and HREM Modes

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Interactive Analysis of Terabyte-sized SEM-EDS Hyperspectral Images

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How to Process Zillions of Spectra from Spectral Imaging Datasets? From Phase-Mapping to Bulk-Chemistry on Micron- to Centimeter Scale Using PARC

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Identification of New Lithic Clasts in Lunar Breccia 14305 by micro-CT and micro-XRF analysis

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X-Ray Microanalysis with High Spatial Resolution and High Counts Rate with a State of the Art Field Emission Scanning Electron Microscope

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X-Ray Mapping Investigations of Salt Migration in Seeds through use of Window and Windowless Silicon Drift Detectors

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X-ray Mapping and Chemical Phase Mapping with an Amptek SDD

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Support Vector Machines for Classification and Quantitative Analysis

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X-ray Quantitative Microanalysis Maps across Interfaces of a Cu-Al Roll Bonded Laminate with an Annular Silicon Drift Detector

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Mitigating Thermal Beam Damage with Metallic Coats in Low Voltage FEG-EPMA of Geological Materials

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The Use of a High-Resolution, High-Contrast X-ray Microscope to Probe the Internal Structure of Low Z Materials

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Characterization of Rare Earth Element Ores with High Spatial Resolution Scanning Electron Microscopy

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Investigation of Multiple, Large Area EDS Detectors on an SEM Capable of Various Mounting Geometries for Optimal EDS Analysis

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Fluorescence Micro-tomography of Frozen-hydrated Whole Cells using the Bionanoprobe

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Multidimensional Data Sets - Presentation, Evaluation and Extraction

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Large Area EDS Mapping: Automated Collection of High Resolution Elemental Maps For Post Acquisition Analysis

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Mineral Analyses & Implications on the Dispersion of Bismuth in the Supergene Environment of Eastern Australia

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Need for Large-Area EDS Detectors for Imaging Nanoparticles in a SEM Operating in Transmission Mode

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