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Books
Desorption mass spectrometry : are SIMS and FAB the same? / Philip A. Lyon, editor.
Publisher:Washington, D.C. : American Chemical Society, 1985.
Date:1985.
Call Numbers:T0389817
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Books
Surface analysis methods in materials science / D.J. O'Connor, B.A. Sexton, R. St. C. Smart, eds.
Publisher:Berlin ; New York : Springer-Verlag, c1992.
Call Numbers:N620.44/1
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ebooks
Gale Encyclopedia of Science.
Publisher:FARMINGTON HILLS : Cengage Gale, 2021.
Edition:6th ed.
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ArticlesPeer ReviewedFull Text
Oxycarbide MXenes and MAX phases identification using monoatomic layer-by-layer analysis with ultralow-energy secondary-ion mass spectrometry
Author / Creator:Michałowski, Paweł P. ; Anayee, Mark ; Mathis, Tyler S. ; Kozdra, Sylwia ; Wójcik, Adrianna ; Hantanasirisakul, Kanit ; Jóźwik, Iwona ; Piątkowska, Anna ; Możdżonek, Małgorzata ; Malinowska, Agnieszka ; Diduszko, Ryszard ; Wierzbicka, Edyta ; Gogotsi, Yury
Publisher:London: Nature Publishing Group UK
Journal title:Nature nanotechnology, 2022-11, Vol.17 (11), p.1192-1197
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(CO2)n+, (H2O)n+, and (H2O)n+ (CO2) gas cluster ion beam secondary ion mass spectrometry: analysis of lipid extracts, cells, and Alzheimer’s model mouse brain tissue
Author / Creator:Dimovska Nilsson, Kelly ; Karagianni, Anthi ; Kaya, Ibrahim ; Henricsson, Marcus ; Fletcher, John S.
Publisher:Berlin/Heidelberg: Springer Berlin Heidelberg
Journal title:Analytical and bioanalytical chemistry, 2021-07, Vol.413 (16), p.4181-4194
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Correlative fluorescence microscopy, transmission electron microscopy and secondary ion mass spectrometry (CLEM-SIMS) for cellular imaging
Author / Creator:Lange, Felix ; Agüi-Gonzalez, Paola ; Riedel, Dietmar ; Phan, Nhu T N ; Jakobs, Stefan ; Rizzoli, Silvio O
Publisher:United States: Public Library of Science
Journal title:PloS one, 2021-05, Vol.16 (5), p.e0240768-e0240768
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ArticlesPeer ReviewedFull Text
Topography and Field Effects in Secondary Ion Mass Spectrometry – Part I: Conducting Samples
Author / Creator:Lee, Joanna L. S. ; Gilmore, Ian S. ; Seah, Martin P. ; Fletcher, Ian W.
Publisher:New York: Springer-Verlag
Journal title:Journal of the American Society for Mass Spectrometry, 2011-10, Vol.22 (10), p.1718-1728, Article s13361-011-0201-1
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Time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging reveals cholesterol overload in the cerebral cortex of Alzheimer disease patients
Author / Creator:Lazar, Adina N. ; Bich, Claudia ; Panchal, Maï ; Desbenoit, Nicolas ; Petit, Vanessa W. ; Touboul, David ; Dauphinot, Luce ; Marquer, Catherine ; Laprévote, Olivier ; Brunelle, Alain ; Duyckaerts, Charles
Publisher:Berlin/Heidelberg: Springer-Verlag
Journal title:Acta neuropathologica, 2013-01, Vol.125 (1), p.133-144
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Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)
Author / Creator:Michałowski, Paweł Piotr ; Kaszub, Wawrzyniec ; Pasternak, Iwona ; Strupiński, Włodek
Publisher:London: Nature Publishing Group UK
Journal title:Scientific reports, 2017-08, Vol.7 (1), p.7479-8, Article 7479
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Review of Recent Advances in Gas-Assisted Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry (FIB-TOF-SIMS)
Author / Creator:Priebe, Agnieszka ; Michler, Johann
Publisher:Switzerland: MDPI AG
Journal title:Materials, 2023-03, Vol.16 (5), p.2090
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Biological tissue sample preparation for time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging
Author / Creator:Yoon, Sohee ; Lee, Tae Geol
Publisher:Singapore: Springer Singapore
Journal title:Nano Convergence, 2018, 5(24), , pp.1-13
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ArticlesPeer ReviewedFull Text
Enamel Fluoride Uptake Determined Using the Microbiopsy Technique and Time-of-Flight Secondary Ion Mass Spectrometry: A Pilot Study
Author / Creator:Michler, Nicole ; Morawietz, Maria ; Gierth, Stephan ; Lippert, Frank ; Kiesow, Andreas
Publisher:Basel, Switzerland: S. Karger AG
Journal title:Caries research, 2023-11, Vol.57 (4), p.546-552
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Determination of the concentration of impurities in GaN from photoluminescence and secondary-ion mass spectrometry
Author / Creator:Reshchikov, M. A. ; Vorobiov, M. ; Andrieiev, O. ; Ding, K. ; Izyumskaya, N. ; Avrutin, V. ; Usikov, A. ; Helava, H. ; Makarov, Yu
Publisher:London: Nature Publishing Group UK
Journal title:Scientific reports, 2020-02, Vol.10 (1), p.2223-2223, Article 2223
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Age and growth of Astarte borealis (Bivalvia) from the southwestern Baltic Sea using secondary ion mass spectrometry
Author / Creator:Moss, David K. ; Surge, Donna ; Zettler, Michael L. ; Orland, Ian J. ; Burnette, Alex ; Fancher, Abby
Publisher:Berlin/Heidelberg: Springer Berlin Heidelberg
Journal title:Marine biology, 2021-08, Vol.168 (8), Article 133
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Interaction of Bis-(sodium-sulfopropyl)-Disulfide and Polyethylene Glycol on the Copper Electrodeposited Layer by Time-of-Flight Secondary-Ion Mass Spectrometry
Author / Creator:Mroczka, Robert ; Słodkowska, Agnieszka ; Ładniak, Agata ; Chrzanowska, Agnieszka
Publisher:Switzerland: MDPI AG
Journal title:Molecules (Basel, Switzerland), 2023-01, Vol.28 (1), p.433
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ArticlesPeer ReviewedFull Text
gas cluster ion beam secondary ion mass spectrometry: analysis of lipid extracts, cells, and Alzheimer's model mouse brain tissue
Author / Creator:Dimovska Nilsson, Kelly ; Karagianni, Anthi ; Kaya, Ibrahim ; Henricsson, Marcus ; Fletcher, John S
Publisher:Springer
Journal title:Analytical and bioanalytical chemistry, 2021-07, Vol.413 (16), p.4181
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ArticlesPeer ReviewedFull Text
Correlated fluorescence microscopy and multi-ion beam secondary ion mass spectrometry imaging reveals phosphatidylethanolamine increases in the membrane of cancer cells over-expressing the molecular c...
Author / Creator:Fletcher, John S. ; Sämfors, Sanna ; Vallin, Josefine ; Svanström, Andreas ; Grantham, Julie
Publisher:Berlin/Heidelberg: Springer Berlin Heidelberg
Journal title:Analytical and bioanalytical chemistry, 2021-01, Vol.413 (2), p.445-453
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Studies of Bis-(Sodium-Sulfopropyl)-Disulfide and 3-Mercapto-1-Propanesulfonate on/into the Copper Electrodeposited Layer by Time-of-Flight Secondary-Ion Mass Spectrometry
Author / Creator:Mroczka, Robert ; Słodkowska, Agnieszka ; Ładniak, Agata
Publisher:Switzerland: MDPI AG
Journal title:Molecules (Basel, Switzerland), 2022-11, Vol.27 (23), p.8116
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MS/MS analysis and imaging of lipids across Drosophila brain using secondary ion mass spectrometry
Author / Creator:Phan, Nhu T. N. ; Munem, Marwa ; Ewing, Andrew G. ; Fletcher, John S.
Publisher:Berlin/Heidelberg: Springer Berlin Heidelberg
Journal title:Analytical and bioanalytical chemistry, 2017-06, Vol.409 (16), p.3923-3932
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Intact lipid imaging of mouse brain samples: MALDI, nanoparticle-laser desorption ionization, and 40 keV argon cluster secondary ion mass spectrometry
Author / Creator:Mohammadi, Amir Saeid ; Phan, Nhu T.N. ; Fletcher, John S. ; Ewing, Andrew G.
Publisher:Berlin/Heidelberg: Springer Berlin Heidelberg
Journal title:Analytical and bioanalytical chemistry, 2016-09, Vol.408 (24), p.6857-6868
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Desorption mass spectrometry : are SIMS and FAB the same? / Philip A. Lyon, editor.

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Surface analysis methods in materials science / D.J. O'Connor, B.A. Sexton, R. St. C. Smart, eds.

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Gale Encyclopedia of Science.

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Oxycarbide MXenes and MAX phases identification using monoatomic layer-by-layer analysis with ultralow-energy secondary-ion mass spectrometry

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(CO2)n+, (H2O)n+, and (H2O)n+ (CO2) gas cluster ion beam secondary ion mass spectrometry: analysis of lipid extracts, cells, and Alzheimer’s model mouse brain tissue

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Correlative fluorescence microscopy, transmission electron microscopy and secondary ion mass spectrometry (CLEM-SIMS) for cellular imaging

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Topography and Field Effects in Secondary Ion Mass Spectrometry – Part I: Conducting Samples

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Time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging reveals cholesterol overload in the cerebral cortex of Alzheimer disease patients

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Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)

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Review of Recent Advances in Gas-Assisted Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry (FIB-TOF-SIMS)

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Biological tissue sample preparation for time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging

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Enamel Fluoride Uptake Determined Using the Microbiopsy Technique and Time-of-Flight Secondary Ion Mass Spectrometry: A Pilot Study

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Determination of the concentration of impurities in GaN from photoluminescence and secondary-ion mass spectrometry

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Age and growth of Astarte borealis (Bivalvia) from the southwestern Baltic Sea using secondary ion mass spectrometry

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Interaction of Bis-(sodium-sulfopropyl)-Disulfide and Polyethylene Glycol on the Copper Electrodeposited Layer by Time-of-Flight Secondary-Ion Mass Spectrometry

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gas cluster ion beam secondary ion mass spectrometry: analysis of lipid extracts, cells, and Alzheimer's model mouse brain tissue

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Correlated fluorescence microscopy and multi-ion beam secondary ion mass spectrometry imaging reveals phosphatidylethanolamine increases in the membrane of cancer cells over-expressing the molecular c...

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Studies of Bis-(Sodium-Sulfopropyl)-Disulfide and 3-Mercapto-1-Propanesulfonate on/into the Copper Electrodeposited Layer by Time-of-Flight Secondary-Ion Mass Spectrometry

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MS/MS analysis and imaging of lipids across Drosophila brain using secondary ion mass spectrometry

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Intact lipid imaging of mouse brain samples: MALDI, nanoparticle-laser desorption ionization, and 40 keV argon cluster secondary ion mass spectrometry

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