Electromigration and electronic device degradation / edited by Aris Christou.
Electromigration and electronic device degradation / edited by Aris Christou.
Electromigration and electronic device degradation / edited by Aris Christou.
About this item
Full title
Publisher
New York : Wiley, c1994.
Alternative title
Call Numbers
N621.3815/130
Record Identifier
MMS ID
Language
English
Formats
Physical Description
Physical content
xiv, 343 p. : ill. ; 25 cm.
Contents
1. Reliability and Electromigration Degradation of GaAs Microwave Monolithic Integrated Circuits / Aris Christou -- 2. Simulation and Computer Models for Electromigration / Pin Fang Tang -- 3. Temperature Dependencies on Electromigration / Michael Pecht and Pradeep Lall -- 4. Electromigration and Re...
Publication information
Publisher
New York : Wiley, c1994.
Analytical title
Electromigration & electronic device degradation.
Place of Publication
New York (State)
Date Published
c1994.
Subjects
More information
Alternative Titles
Full title
Electromigration and electronic device degradation / edited by Aris Christou.
Variant title
Electromigration & electronic device degradation.
Authors, Artists and Contributors
Author / Artists
Notes
General note
Spine title: Electromigration & electronic device degradation.
Includes bibliographical references and index.
Contextual Information
Date Copyright
c1994.
Related resource (online)
Identifiers
Primary Identifiers
Call Numbers
N621.3815/130
Record Identifier
74VKvKLgwm7O
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/74VKvKLgwm7O
Other Identifiers
ISBN
0471584894 (cloth : alk. paper)
9780471584896 (cloth : alk. paper)
DDC
621.3815
MMS ID
991021490109702626
