Optical metrology embraces deep learning: keeping an open mind
Optical metrology embraces deep learning: keeping an open mind
Publication information
Publisher
London: Nature Publishing Group UK
Subjects
More information
Scope and Contents
Contents
Abstract Optical metrology practitioners ought to embrace deep learning with an open mind, while devote continuing efforts to look for its theoretical groundwork and maintain an awareness of its limits.
Alternative Titles
Full title
Optical metrology embraces deep learning: keeping an open mind
Authors, Artists and Contributors
Author / Creator
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_doaj_primary_oai_doaj_org_article_04690838ca744351961a28b5c8f9e6fb
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_04690838ca744351961a28b5c8f9e6fb
Other Identifiers
ISSN
2047-7538,2095-5545
E-ISSN
2047-7538
DOI
10.1038/s41377-022-00829-1
