Multi-pass transmission electron microscopy
Multi-pass transmission electron microscopy
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Publisher
London: Nature Publishing Group UK
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Language
English
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Publisher
London: Nature Publishing Group UK
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Feynman once asked physicists to build better electron microscopes to be able to watch biology at work. While electron microscopes can now provide atomic resolution, electron beam induced specimen damage precludes high resolution imaging of sensitive materials, such as single proteins or polymers. Here, we use simulations to show that an electron m...
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Multi-pass transmission electron microscopy
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TN_cdi_doaj_primary_oai_doaj_org_article_05664e9adc6440389dfa58b953d0c968
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_05664e9adc6440389dfa58b953d0c968
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ISSN
2045-2322
E-ISSN
2045-2322
DOI
10.1038/s41598-017-01841-x
