Cloning of the wheat Yr15 resistance gene sheds light on the plant tandem kinase-pseudokinase family
Cloning of the wheat Yr15 resistance gene sheds light on the plant tandem kinase-pseudokinase family
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Author / Creator
Klymiuk, Valentina , Yaniv, Elitsur , Huang, Lin , Raats, Dina , Fatiukha, Andrii , Chen, Shisheng , Feng, Lihua , Frenkel, Zeev , Krugman, Tamar , Lidzbarsky, Gabriel , Chang, Wei , Jääskeläinen, Marko J. , Schudoma, Christian , Paulin, Lars , Laine, Pia , Bariana, Harbans , Sela, Hanan , Saleem, Kamran , Sørensen, Chris Khadgi , Hovmøller, Mogens S. , Distelfeld, Assaf , Chalhoub, Boulos , Dubcovsky, Jorge , Korol, Abraham B. , Schulman, Alan H. and Fahima, Tzion
Publisher
London: Nature Publishing Group UK
Journal title
Language
English
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Publication information
Publisher
London: Nature Publishing Group UK
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More information
Scope and Contents
Contents
Yellow rust, caused by
Puccinia striiformis
f. sp.
tritici
(
Pst
), is a devastating fungal disease threatening much of global wheat production. Race-specific resistance (
R
)-genes are used to control rust diseases, but the rapid emergence of virulent
Pst
races has prompted the search for a more durable resistance. He...
Alternative Titles
Full title
Cloning of the wheat Yr15 resistance gene sheds light on the plant tandem kinase-pseudokinase family
Authors, Artists and Contributors
Author / Creator
Yaniv, Elitsur
Huang, Lin
Raats, Dina
Fatiukha, Andrii
Chen, Shisheng
Feng, Lihua
Frenkel, Zeev
Krugman, Tamar
Lidzbarsky, Gabriel
Chang, Wei
Jääskeläinen, Marko J.
Schudoma, Christian
Paulin, Lars
Laine, Pia
Bariana, Harbans
Sela, Hanan
Saleem, Kamran
Sørensen, Chris Khadgi
Hovmøller, Mogens S.
Distelfeld, Assaf
Chalhoub, Boulos
Dubcovsky, Jorge
Korol, Abraham B.
Schulman, Alan H.
Fahima, Tzion
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Primary Identifiers
Record Identifier
TN_cdi_doaj_primary_oai_doaj_org_article_2c039f0c17bd49bda9be577c91659dba
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_2c039f0c17bd49bda9be577c91659dba
Other Identifiers
ISSN
2041-1723
E-ISSN
2041-1723
DOI
10.1038/s41467-018-06138-9