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Modeling Si/SiGe quantum dot variability induced by interface disorder reconstructed from multipersp...

Modeling Si/SiGe quantum dot variability induced by interface disorder reconstructed from multipersp...

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_362fef6038e248b0889ef427e785a31e

Modeling Si/SiGe quantum dot variability induced by interface disorder reconstructed from multiperspective microscopy

About this item

Full title

Modeling Si/SiGe quantum dot variability induced by interface disorder reconstructed from multiperspective microscopy

Publisher

London: Nature Publishing Group UK

Journal title

npj quantum information, 2024-03, Vol.10 (1), p.33-10, Article 33

Language

English

Formats

Publication information

Publisher

London: Nature Publishing Group UK

More information

Scope and Contents

Contents

SiGe heteroepitaxial growth yields pristine host material for quantum dot qubits, but residual interface disorder can lead to qubit-to-qubit variability that might pose an obstacle to reliable SiGe-based quantum computing. By convolving data from scanning tunneling microscopy and high-angle annular dark field scanning transmission electron microsco...

Alternative Titles

Full title

Modeling Si/SiGe quantum dot variability induced by interface disorder reconstructed from multiperspective microscopy

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_doaj_primary_oai_doaj_org_article_362fef6038e248b0889ef427e785a31e

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_362fef6038e248b0889ef427e785a31e

Other Identifiers

ISSN

2056-6387

E-ISSN

2056-6387

DOI

10.1038/s41534-024-00827-8

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