Log in to save to my catalogue

Excel Methods to Design and Validate in Microelectronics (Complementary Metal–Oxide–Semiconductor, C...

Excel Methods to Design and Validate in Microelectronics (Complementary Metal–Oxide–Semiconductor, C...

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_3d1eb17b3d4a482bb49baf2cdab25d3f

Excel Methods to Design and Validate in Microelectronics (Complementary Metal–Oxide–Semiconductor, CMOS) for Biomedical Instrumentation Application

About this item

Full title

Excel Methods to Design and Validate in Microelectronics (Complementary Metal–Oxide–Semiconductor, CMOS) for Biomedical Instrumentation Application

Publisher

Basel: MDPI AG

Journal title

Sensors (Basel, Switzerland), 2021-11, Vol.21 (22), p.7486

Language

English

Formats

Publication information

Publisher

Basel: MDPI AG

More information

Scope and Contents

Contents

CMOS microelectronics design has evolved tremendously during the last two decades. The evolution of CMOS devices to short channel designs where the feature size is below 1000 nm brings a great deal of uncertainty in the way the microelectronics design cycle is completed. After the conceptual idea, developing a thinking model to understand the opera...

Alternative Titles

Full title

Excel Methods to Design and Validate in Microelectronics (Complementary Metal–Oxide–Semiconductor, CMOS) for Biomedical Instrumentation Application

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_doaj_primary_oai_doaj_org_article_3d1eb17b3d4a482bb49baf2cdab25d3f

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_3d1eb17b3d4a482bb49baf2cdab25d3f

Other Identifiers

ISSN

1424-8220

E-ISSN

1424-8220

DOI

10.3390/s21227486

How to access this item