Determination of the Exact Orientation of Single-Crystal X-ray Optics from Its Glitch Spectrum and M...
Determination of the Exact Orientation of Single-Crystal X-ray Optics from Its Glitch Spectrum and Modeling of Glitches for an Arbitrary Configuration
About this item
Full title
Author / Creator
Publisher
Basel: MDPI AG
Journal title
Language
English
Formats
Publication information
Publisher
Basel: MDPI AG
Subjects
More information
Scope and Contents
Contents
X-ray optics made of single-crystal materials are widely used at most of the X-ray sources due to the outstanding properties. The main drawback of such optics—the diffraction losses, also known as glitches of intensity in the energy spectrum of the transmitted/diffracted beam. To be able to handle this negative effect, one needs a reliable way to s...
Alternative Titles
Full title
Determination of the Exact Orientation of Single-Crystal X-ray Optics from Its Glitch Spectrum and Modeling of Glitches for an Arbitrary Configuration
Authors, Artists and Contributors
Author / Creator
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_doaj_primary_oai_doaj_org_article_657a5d809aed47438ad23c35bd97c7e6
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_657a5d809aed47438ad23c35bd97c7e6
Other Identifiers
ISSN
2073-4352
E-ISSN
2073-4352
DOI
10.3390/cryst11050504
