Logistic Regression for Machine Learning in Process Tomography
Logistic Regression for Machine Learning in Process Tomography
About this item
Full title
Author / Creator
Publisher
Switzerland: MDPI AG
Journal title
Language
English
Formats
Publication information
Publisher
Switzerland: MDPI AG
Subjects
More information
Scope and Contents
Contents
The main goal of the research presented in this paper was to develop a refined machine learning algorithm for industrial tomography applications. The article presents algorithms based on logistic regression in relation to image reconstruction using electrical impedance tomography (EIT) and ultrasound transmission tomography (UST). The test object w...
Alternative Titles
Full title
Logistic Regression for Machine Learning in Process Tomography
Authors, Artists and Contributors
Author / Creator
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_doaj_primary_oai_doaj_org_article_76aac811724d4a529d7dc4ebabacdec8
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_76aac811724d4a529d7dc4ebabacdec8
Other Identifiers
ISSN
1424-8220
E-ISSN
1424-8220
DOI
10.3390/s19153400
