Tackling the Challenging Determination of Trace Elements in Ultrapure Silicon Carbide by LA-ICP-MS
Tackling the Challenging Determination of Trace Elements in Ultrapure Silicon Carbide by LA-ICP-MS
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Publisher
Switzerland: MDPI AG
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Language
English
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Publisher
Switzerland: MDPI AG
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Contents
The goal of accurately quantifying trace elements in ultrapure silicon carbide (SiC) with a purity target of 5N (99.999% purity) was addressed. The unsuitability of microwave-assisted acid digestion followed by Inductively Coupled Plasma Mass Spectrometry (ICP-MS) analysis was proved to depend mainly on the contamination induced by memory effects o...
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Full title
Tackling the Challenging Determination of Trace Elements in Ultrapure Silicon Carbide by LA-ICP-MS
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TN_cdi_doaj_primary_oai_doaj_org_article_eebaccabc12842688c09e7bfc513bdaf
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_eebaccabc12842688c09e7bfc513bdaf
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ISSN
1420-3049
E-ISSN
1420-3049
DOI
10.3390/molecules28062845
