Microstructure Design for Fast Lifetime Measurements of Magnetic Tunneling Junctions
Microstructure Design for Fast Lifetime Measurements of Magnetic Tunneling Junctions
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Publisher
Switzerland: MDPI
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Language
English
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Publisher
Switzerland: MDPI
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Contents
The estimation of the reliability of magnetic field sensors against failure is a critical point concerning their application for industrial purposes. Due to the physical stochastic nature of the failure events, this can only be done by means of a statistical approach which is extremely time consuming and prevents a continuous observation of the pro...
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Full title
Microstructure Design for Fast Lifetime Measurements of Magnetic Tunneling Junctions
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TN_cdi_doaj_primary_oai_doaj_org_article_f7db9cac1b1d42c9811e4432ce9842ae
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_f7db9cac1b1d42c9811e4432ce9842ae
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ISSN
1424-8220
E-ISSN
1424-8220
DOI
10.3390/s19030583
