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In Situ TEM Characterization of Nanostructured Dielectrics

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In Situ TEM Characterization of Nanostructured Dielectrics

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_1871730006

In Situ TEM Characterization of Nanostructured Dielectrics

About this item

Full title

In Situ TEM Characterization of Nanostructured Dielectrics

Author / Creator

Hsiao, Ming-Siao , Yuan, Yifei , Grabowski, Christopher , Nie, Anmin , Shabazian-Yassar, Reza and Drummy, Lawrence F.

Publisher

New York, USA: Cambridge University Press

Journal title

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.1813-1814

Language

English

Formats

Articles

Publication information

Publisher

New York, USA: Cambridge University Press

Subjects

More information

Alternative Titles

Full title

In Situ TEM Characterization of Nanostructured Dielectrics

Authors, Artists and Contributors

Author / Creator

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_proquest_journals_1871730006

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_1871730006

Other Identifiers

ISSN

1431-9276

E-ISSN

1435-8115

DOI

10.1017/S1431927615009848

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