Highly sensitive frequency metrology for optical anisotropy measurements
Highly sensitive frequency metrology for optical anisotropy measurements
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Ithaca: Cornell University Library, arXiv.org
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English
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Ithaca: Cornell University Library, arXiv.org
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In this paper we present a novel apparatus aimed at measuring very small birefringences and anisotropies, based on frequency metrology and not on polarimetry as usual. In our experiment, a very high finesse resonant cavity is used to convert the phase difference into a resonance frequency difference, which can then be measured with very high accura...
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Full title
Highly sensitive frequency metrology for optical anisotropy measurements
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TN_cdi_proquest_journals_2082183543
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2082183543
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E-ISSN
2331-8422
DOI
10.48550/arxiv.1002.3812
