Robustness of attractors in tapping mode atomic force microscopy
Robustness of attractors in tapping mode atomic force microscopy
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Publisher
Dordrecht: Springer Netherlands
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Language
English
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Publisher
Dordrecht: Springer Netherlands
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In this work, we perform a comprehensive analysis of the robustness of attractors in tapping mode atomic force microscopy. The numerical model is based on cantilever dynamics driven in the Lennard–Jones potential. Pseudo-arc-length continuation and basins of attraction are utilized to obtain the frequency response and dynamical integrity of the att...
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Full title
Robustness of attractors in tapping mode atomic force microscopy
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Author / Creator
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TN_cdi_proquest_journals_2269294459
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2269294459
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ISSN
0924-090X
E-ISSN
1573-269X
DOI
10.1007/s11071-019-05037-y
