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Observed edge radius behavior during MD nanomachining of silicon at a high uncut chip thickness

Observed edge radius behavior during MD nanomachining of silicon at a high uncut chip thickness

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2490846998

Observed edge radius behavior during MD nanomachining of silicon at a high uncut chip thickness

About this item

Full title

Observed edge radius behavior during MD nanomachining of silicon at a high uncut chip thickness

Publisher

London: Springer London

Journal title

International journal of advanced manufacturing technology, 2019-04, Vol.101 (5-8), p.1741-1757

Language

English

Formats

Publication information

Publisher

London: Springer London

More information

Scope and Contents

Contents

During ultraprecision turning of optical silicon, size effect determined by the ratio of undeformed chip thickness to tool cutting edge radius remains an important determinant of both compressive and shear stresses in the workpiece around the cutting edge (cutting zone). Plastic deformation which is a factor of both stresses is considered crucial t...

Alternative Titles

Full title

Observed edge radius behavior during MD nanomachining of silicon at a high uncut chip thickness

Authors, Artists and Contributors

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_proquest_journals_2490846998

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2490846998

Other Identifiers

ISSN

0268-3768

E-ISSN

1433-3015

DOI

10.1007/s00170-018-3001-y

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