Full-field cavity enhanced microscopy techniques
Full-field cavity enhanced microscopy techniques
About this item
Full title
Full-field cavity enhanced microscopy techniques
Author / Creator
Publisher
Bristol: IOP Publishing
Journal title
JPhys photonics, 2019-01, Vol.1 (1), p.15007
Language
English
Formats
Publication information
Publisher
Bristol: IOP Publishing
Subjects
More information
Scope and Contents
Contents
The number of probe particles that is detected on a single pixel of a micrograph is finite, either due to source (low power), detector (low dynamic range) or specimen damage constraints. The sensitivity of an otherwise perfect microscope is then limited by the statistical fluctuations in the number of detected particles. It is thus crucial to striv...
Alternative Titles
Full title
Full-field cavity enhanced microscopy techniques
Authors, Artists and Contributors
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_proquest_journals_2547647076
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2547647076
Other Identifiers
ISSN
2515-7647
E-ISSN
2515-7647
DOI
10.1088/2515-7647/aae228
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