Atomic-resolution transmission electron microscopy of electron beam-sensitive crystalline materials
Atomic-resolution transmission electron microscopy of electron beam-sensitive crystalline materials
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Publisher
United States: The American Association for the Advancement of Science
Journal title
Language
English
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Publication information
Publisher
United States: The American Association for the Advancement of Science
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Scope and Contents
Contents
High-resolution imaging of electron beam-sensitive materials is one of the most difficult applications of transmission electron microscopy (TEM). The challenges are manifold, including the acquisition of images with extremely low beam doses, the time-constrained search for crystal zone axes, the precise image alignment, and the accurate determinati...
Alternative Titles
Full title
Atomic-resolution transmission electron microscopy of electron beam-sensitive crystalline materials
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Record Identifier
TN_cdi_proquest_miscellaneous_1989606302
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_miscellaneous_1989606302
Other Identifiers
ISSN
0036-8075
E-ISSN
1095-9203
DOI
10.1126/science.aao0865
