Reducing Test Time Using an Enhanced RF Loopback
Reducing Test Time Using an Enhanced RF Loopback
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Boston: Springer Nature B.V
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English
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Boston: Springer Nature B.V
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Issue Title: SPECIAL ISSUE ON ANALOG, MIXED-SIGNAL AND RF TESTING This work presents a method to improve the loopback test used in RF transceivers. The approach is targeted to the System-On-Chip environment, being able to reuse system resources in order to minimize the test overhead. An RF sampler is used during loopback operation, allowing observa...
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Full title
Reducing Test Time Using an Enhanced RF Loopback
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TN_cdi_proquest_miscellaneous_31503331
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_miscellaneous_31503331
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ISSN
0923-8174
E-ISSN
1573-0727
DOI
10.1007/s10836-007-5026-2
