Consumer Electronics; Data on Consumer Electronics Discussed by D. Park and Colleagues
Consumer Electronics; Data on Consumer Electronics Discussed by D. Park and Colleagues
About this item
Full title
Consumer Electronics; Data on Consumer Electronics Discussed by D. Park and Colleagues
Publisher
Atlanta: NewsRx
Journal title
Leisure & Travel Week, 2011, p.48
Language
English
Formats
Publication information
Publisher
Atlanta: NewsRx
More information
Scope and Contents
Contents
According to recent research published in the journal IEEE Transactions on Consumer Electronics, The floating-gate coupling noise is a major cause of errors in the multi-level cell (MLC) NAND flash memory.
Alternative Titles
Full title
Consumer Electronics; Data on Consumer Electronics Discussed by D. Park and Colleagues
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_proquest_wirefeeds_863800282
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_wirefeeds_863800282
Other Identifiers
ISSN
1944-2386
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