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ArticlesPeer ReviewedFull Text
ToF-S-SIMS molecular 3D analysis of micro-objects as an alternative to ion beam erosion at large depth: application to single inkjet dots
Author / Creator:Vercammen, Yannick ; Van Luppen, Jaymes ; Van Roost, Christiaan ; De Mondt, Roel ; Vangaever, Frank ; Van Vaeck, Luc
Publisher:Berlin/Heidelberg: Springer-Verlag
Journal title:Analytical and bioanalytical chemistry, 2013-02, Vol.405 (6), p.2053-2064
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ArticlesPeer ReviewedFull Text
Static secondary ion mass spectrometry for the surface characterisation of individual nanofibres of polycaprolactone functionalised with an antibacterial additive
Author / Creator:Van Royen, Pieter ; Boschmans, Bart ; dos Santos, Ana ; Schacht, Etienne ; Dubruel, Peter ; Cornelissen, Ria ; Beenaerts, Linda ; Van Vaeck, Luc
Publisher:Berlin/Heidelberg: Springer-Verlag
Journal title:Analytical and bioanalytical chemistry, 2011-01, Vol.399 (3), p.1163-1172
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ArticlesPeer ReviewedFull Text
Ultra-low-angle microtomy and static secondary ion mass spectrometry for molecular depth profiling of UV-curable acrylate multilayers at the nanoscale
Author / Creator:Vercammen, Yannick ; De Mondt, Roel ; Van Luppen, Jaymes ; Vangaever, Frank ; Van Vaeck, Luc
Publisher:Berlin/Heidelberg: Berlin/Heidelberg : Springer-Verlag
Journal title:Analytical and bioanalytical chemistry, 2010-04, Vol.396 (8), p.2943-2954
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ArticlesPeer ReviewedFull Text
Methods, fluxes and sources of gas phase alkyl nitrates in the coastal air
Author / Creator:Dirtu, Alin C ; Buczyńska, Anna J ; Godoi, Ana F. L ; Favoreto, Rodrigo ; Bencs, László ; Potgieter-Vermaak, Sanja S ; Godoi, Ricardo H. M ; Van Grieken, René ; Van Vaeck, Luc
Publisher:Cham: Springer-Verlag
Journal title:Environmental monitoring and assessment, 2014-10, Vol.186 (10), p.6445-6457
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ArticlesPeer ReviewedFull Text
In Situ Temperature-Time Effect on MetA-S-SIMS
Author / Creator:De Mondt, Roel ; Van Vaeck, Luc ; Lenaerts, Jens
Publisher:New York, NY: Elsevier Inc
Journal title:Journal of the American Society for Mass Spectrometry, 2007-03, Vol.18 (3), p.382-384
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ArticlesPeer ReviewedFull Text
TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodology
Author / Creator:De Mondt, Roel ; Van Vaeck, Luc ; Heile, Andreas ; Arlinghaus, Heinrich F ; Vangaever, Frank ; Lenaerts, Jens
Publisher:Berlin/Heidelberg: Berlin/Heidelberg : Springer-Verlag
Journal title:Analytical and bioanalytical chemistry, 2009-04, Vol.393 (8), p.1917-1921
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ArticlesPeer ReviewedFull Text
Multi-slice computed tomography with N1177 identifies ruptured atherosclerotic plaques in rabbits
Author / Creator:Van Herck, Jozef Leo ; De Meyer, Guido R. Y. ; Martinet, Wim ; Salgado, Rodrigo A. ; Shivalkar, Bharati ; De Mondt, Roel ; Van De Ven, Helene ; Ludwig, Annick ; Van Der Veken, Pieter ; Van Vaeck, Luc ; Bult, Hidde ; Herman, Arnold G. ; Vrints, Christiaan J.
Publisher:Heidelberg: D. Steinkopff-Verlag
Journal title:Basic research in cardiology, 2010-01, Vol.105 (1), p.51-59
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ArticlesPeer ReviewedFull Text
Feasibility of analyzing molecular pigments in paint layers using TOF S-SIMS
Author / Creator:Van Ham, Rita ; Van Vaeck, Luc ; Adams, Freddy ; Adriaens, Annemie
Publisher:Germany: Berlin/Heidelberg : Springer-Verlag
Journal title:Analytical and bioanalytical chemistry, 2005-11, Vol.383 (6), p.991-997
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ArticlesPeer ReviewedFull Text
Fourier Transform Laser Microprobe Mass Spectrometry for the Molecular Identification of Inorganic Compounds
Author / Creator:Struyf, Herbert ; Van Vaeck, Luc ; Poels, Katrien ; Van Grieken, René
Publisher:New York, NY: Elsevier Inc
Journal title:Journal of the American Society for Mass Spectrometry, 1998-05, Vol.9 (5), p.482-497
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ArticlesPeer ReviewedFull Text
Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary-ion mass spectrometry (SIMS)
Author / Creator:Lenaerts, J. ; Verlinden, Geert ; Ignatova, Velislava A. ; Van Vaeck, L. ; Gijbels, Renaat ; Geuens, Ingrid
Publisher:Berlin: Springer Nature B.V
Journal title:Analytical and bioanalytical chemistry, 2001-07, Vol.370 (5), p.654-662
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ToF-S-SIMS molecular 3D analysis of micro-objects as an alternative to ion beam erosion at large depth: application to single inkjet dots

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Static secondary ion mass spectrometry for the surface characterisation of individual nanofibres of polycaprolactone functionalised with an antibacterial additive

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Ultra-low-angle microtomy and static secondary ion mass spectrometry for molecular depth profiling of UV-curable acrylate multilayers at the nanoscale

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Methods, fluxes and sources of gas phase alkyl nitrates in the coastal air

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In Situ Temperature-Time Effect on MetA-S-SIMS

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TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodology

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Multi-slice computed tomography with N1177 identifies ruptured atherosclerotic plaques in rabbits

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Feasibility of analyzing molecular pigments in paint layers using TOF S-SIMS

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Fourier Transform Laser Microprobe Mass Spectrometry for the Molecular Identification of Inorganic Compounds

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Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary-ion mass spectrometry (SIMS)

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