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Measurement of Thermal Noise in Multilayer Coatings with Optimized Layer Thickness

Measurement of Thermal Noise in Multilayer Coatings with Optimized Layer Thickness

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2084883266

Measurement of Thermal Noise in Multilayer Coatings with Optimized Layer Thickness

About this item

Full title

Measurement of Thermal Noise in Multilayer Coatings with Optimized Layer Thickness

Publisher

Ithaca: Cornell University Library, arXiv.org

Journal title

arXiv.org, 2010-04

Language

English

Formats

Publication information

Publisher

Ithaca: Cornell University Library, arXiv.org

More information

Scope and Contents

Contents

A standard quarter-wavelength multilayer optical coating will produce the highest reflectivity for a given number of coating layers, but in general it will not yield the lowest thermal noise for a prescribed reflectivity. Coatings with the layer thicknesses optimized to minimize thermal noise could be useful in future generation interferometric gra...

Alternative Titles

Full title

Measurement of Thermal Noise in Multilayer Coatings with Optimized Layer Thickness

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_proquest_journals_2084883266

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2084883266

Other Identifiers

E-ISSN

2331-8422

DOI

10.48550/arxiv.1004.1223

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