EBL: Efficient background learning for x-ray security inspection
EBL: Efficient background learning for x-ray security inspection
About this item
Full title
Author / Creator
Wang, Wei , He, Linyang , Li, Yiqing , Zhou, Kai , Li, Linchao , Cheng, Guohua and Wen, Ting
Publisher
New York: Springer US
Journal title
Language
English
Formats
Publication information
Publisher
New York: Springer US
Subjects
More information
Scope and Contents
Contents
A significant issue in X-ray security inspection is that there are considerably more background images than foreground images. Although convolutional neural network (CNN)-based detection models have proven to be effective at detecting objects in X-ray security inspection systems, they are not designed to handle imbalance issues during training. Hen...
Alternative Titles
Full title
EBL: Efficient background learning for x-ray security inspection
Authors, Artists and Contributors
Author / Creator
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_proquest_journals_2815843126
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2815843126
Other Identifiers
ISSN
0924-669X
E-ISSN
1573-7497
DOI
10.1007/s10489-022-04075-1
