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ArticlesPeer ReviewedFull Text
An Early Detection Circuit for Endurance Enhancement of Backfilled Contact Resistive Random Access Memory Array
Author / Creator:Kao, Yun-Feng ; Shih, Jiaw-Ren ; Lin, Chrong Jung ; King, Ya-Chin
Publisher:New York: Springer US
Journal title:Nanoscale research letters, 2021-07, Vol.16 (1), p.114-114, Article 114
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ArticlesPeer ReviewedFull Text
Embedded Micro-detectors for EUV Exposure Control in FinFET CMOS Technology
Author / Creator:Wang, Chien-Ping ; Lin, Burn Jeng ; Wu, Pin-Jiun ; Shih, Jiaw-Ren ; Chih, Yue-Der ; Chang, Jonathan ; Lin, Chrong Jung ; King, Ya-Chin
Publisher:New York: Springer US
Journal title:Nanoscale research letters, 2022-01, Vol.17 (1), p.5-5, Article 5
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ArticlesPeer ReviewedFull Text
Wide range detector of plasma induced charging effect for advanced CMOS BEOL processes
Author / Creator:Chao, Yi-Jie ; Yang, Kai-Wei ; Su, Chi ; Lin, Chrong-Jung ; King, Ya-Chin
Publisher:New York: Springer US
Journal title:Nanoscale research letters, 2021-07, Vol.16 (1), p.112-112, Article 112
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ArticlesPeer ReviewedFull Text
A Study of the Variability in Contact Resistive Random Access Memory by Stochastic Vacancy Model
Author / Creator:Kao, Yun-Feng ; Zhuang, Wei Cheng ; Lin, Chrong-Jung ; King, Ya-Chin
Publisher:New York: Springer US
Journal title:Nanoscale research letters, 2018-07, Vol.13 (1), p.213-10, Article 213
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ArticlesPeer ReviewedFull Text
Improved Conductivity of Low‐Temperature‐Synthesized Graphene/Cu for CMOS Backend‐of‐Line Interconnect Applications
Author / Creator:Wang, Peng‐Chi ; Shih, Yi‐Hsiang ; Tseng, Chih‐Yuan ; Liu, Yu‐Jin ; Huang, Yao‐Hung ; Lin, Chrong‐Jung ; King, Ya‐Chin ; Tu, Wei‐Chen
Publisher:Weinheim: John Wiley & Sons, Inc
Journal title:Advanced materials interfaces, 2025-03, Vol.12 (5), p.n/a
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ArticlesPeer ReviewedFull Text
Test Pattern Design for Plasma Induced Damage on Inter-Metal Dielectric in FinFET Cu BEOL Processes
Author / Creator:Su, Chi ; Tsai, Yi-Pei ; Lin, Chrong-Jung ; King, Ya-Chin
Publisher:New York: Springer US
Journal title:Nanoscale research letters, 2020-05, Vol.15 (1), p.96-96, Article 96
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ArticlesPeer ReviewedFull Text
RTN and Annealing Related to Stress and Temperature in FIND RRAM Array
Author / Creator:Chen, Chih Yuan ; Lin, Chrong Jung ; King, Ya-Chin
Publisher:New York: Springer US
Journal title:Nanoscale research letters, 2019-01, Vol.14 (1), p.12-12, Article 12
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ArticlesPeer ReviewedFull Text
Detectors Array for In Situ Electron Beam Imaging by 16-nm FinFET CMOS Technology
Author / Creator:Wang, Chien-Ping ; Lin, Burn Jeng ; Shih, Jiaw-Ren ; Chih, Yue-Der ; Chang, Jonathan ; Lin, Chrong Jung ; King, Ya-Chin
Publisher:New York: Springer US
Journal title:Nanoscale research letters, 2021-05, Vol.16 (1), p.93-93, Article 93
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ArticlesPeer ReviewedFull Text
Charge Splitting In Situ Recorder (CSIR) for Real-Time Examination of Plasma Charging Effect in FinFET BEOL Processes
Author / Creator:Tsai, Yi-Pei ; Hsieh, Ting-Huan ; Lin, Chrong Jung ; King, Ya-Chin
Publisher:New York: Springer US
Journal title:Nanoscale research letters, 2017-09, Vol.12 (1), p.534-8, Article 534
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ArticlesPeer ReviewedFull Text
Correction to: Charge Splitting In Situ Recorder (CSIR) for Real-Time Examination of Plasma Charging Effect in FinFET BEOL Processes
Author / Creator:Tsai, Yi-Pei ; Hsieh, Ting-Huan ; Lin, Chrong Jung ; King, Ya-Chin
Publisher:New York: Springer US
Journal title:Nanoscale research letters, 2017-11, Vol.12 (1), p.584-1, Article 584
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ArticlesPeer ReviewedFull Text
Design of Versatile Top‐Down Transfer by Thermal Release Tape/Poly(methyl methacrylate) (TRT/PMMA) Bi‐Supporting Layers Toward All‐Transfer Transition Metal Dichalcogenide Material Based Transistor Ar...
Author / Creator:Shen, Ying-Chun ; Wu, Bang-Kai ; Tsai, Tsung-Shun ; Liu, Mingjin ; Chen, Jyun-Hong ; Yang, Tzu-Yi ; Cyu, Ruei-Hong ; Chen, Chieh-Ting ; Hsu, Yu-Chieh ; Luo, Chai-Hung ; Huang, Yu-Qi ; Peng, Yu-Ren ; Shen, Chang-Hong ; Lin, Yen-Fu ; Chiu, Po-Wen ; King, Ya-Chin ; Chueh, Yu-Lun
Publisher:Germany: John Wiley & Sons, Inc
Journal title:Small science, 2024-02, Vol.4 (2), p.2300144-n/a
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ArticlesPeer ReviewedFull Text
High-density via RRAM cell with multi-level setting by current compliance circuits
Author / Creator:Hsieh, Yu-Cheng ; Lin, Yu-Cheng ; Huang, Yao-Hung ; Chih, Yu-Der ; Chang, Jonathan ; Lin, Chrong-Jung ; King, Ya-Chin
Publisher:Heidelberg: Springer Nature B.V
Journal title:Nanoscale research letters, 2024-03, Vol.19 (1), p.54
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ArticlesPeer ReviewedFull Text
Dynamic pH Sensor with Embedded Calibration Scheme by Advanced CMOS FinFET Technology
Author / Creator:Wang, Chien-Ping ; Shen, Ying-Chun ; Liou, Peng-Chun ; Chueh, Yu-Lun ; Chih, Yue-Der ; Chang, Jonathan ; Lin, Chrong-Jung ; King, Ya-Chin
Publisher:Switzerland: MDPI
Journal title:Sensors (Basel, Switzerland), 2019-04, Vol.19 (7), p.1585
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ArticlesPeer ReviewedFull Text
A RRAM Integrated 4T SRAM with Self-Inhibit Resistive Switching Load by Pure CMOS Logic Process
Author / Creator:Hsu, Meng-Yin ; Liao, Chu-Feng ; Shih, Yi-Hong ; Lin, Chrong Jung ; King, Ya-Chin
Publisher:New York: Springer US
Journal title:Nanoscale research letters, 2017-12, Vol.12 (1), p.418-418, Article 418
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ArticlesPeer ReviewedFull Text
Retention Model of TaO/HfO x and TaO/AlO x RRAM with Self-Rectifying Switch Characteristics
Author / Creator:Lin, Yu-De ; Chen, Pang-Shiu ; Lee, Heng-Yuan ; Chen, Yu-Sheng ; Rahaman, Sk Ziaur ; Tsai, Kan-Hsueh ; Hsu, Chien-Hua ; Chen, Wei-Su ; Wang, Pei-Hua ; King, Ya-Chin ; Lin, Chrong Jung
Publisher:United States: SpringerOpen
Journal title:Nanoscale research letters, 2017-12, Vol.12 (1), p.407-407, Article 407
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ArticlesPeer ReviewedFull Text
A study of hydrogen plasma-induced charging effect in EUV lithography systems
Author / Creator:Huang, Yao-Hung ; Lin, Chrong Jung ; King, Ya-Chin
Publisher:Heidelberg: Springer Nature B.V
Journal title:Nanoscale research letters, 2023-02, Vol.18 (1), p.22
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ArticlesPeer ReviewedFull Text
CMOS compatible 2T pixel for on-wafer in-situ EUV detection
Author / Creator:Lin, Wei-Hwa ; Huang, Han-Lin ; Wu, Pin-Jiun ; Lin, Chrong-Jung ; King, Ya-Chin
Publisher:Heidelberg: Springer Nature B.V
Journal title:Nanoscale research letters, 2023-06, Vol.18 (1), p.88
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ArticlesPeer ReviewedFull Text
Retention Model of TaO/HfOx and TaO/AlOx RRAM with Self-Rectifying Switch Characteristics
Author / Creator:Lin, Yu-De ; Chen, Pang-Shiu ; Lee, Heng-Yuan ; Chen, Yu-Sheng ; Rahaman, Sk. Ziaur ; Tsai, Kan-Hsueh ; Hsu, Chien-Hua ; Chen, Wei-Su ; Wang, Pei-Hua ; King, Ya-Chin ; Lin, Chrong Jung
Publisher:New York: Springer US
Journal title:Nanoscale research letters, 2017-06, Vol.12 (1)
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ArticlesPeer ReviewedFull Text
Retention Model of TaO/HfO^sub x^ and TaO/AlO^sub x^ RRAM with Self-Rectifying Switch Characteristics
Author / Creator:Lin, Yu-de ; Chen, Pang-shiu ; Lee, Heng-yuan ; Chen, Yu-sheng ; Rahaman, Sk Ziaur ; Tsai, Kan-hsueh ; Hsu, Chien-hua ; Chen, Wei-su ; Wang, Pei-hua ; King, Ya-chin ; Lin, Chrong Jung
Publisher:Heidelberg: Springer Nature B.V
Journal title:Nanoscale research letters, 2017-06, Vol.12 (1), p.1
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Newsletter articlesFull Text
NATIONAL TSING HUA UNIVERSITY; Patent Issued for Three-Dimensional Integrated Circuit and Method of Transmitting Data within a Three-Dimensional Integrated Circuit (USPTO 9178132)
Publisher:Atlanta: NewsRx
Journal title:Electronics Newsweekly, 2015, p.4487
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Showing 1 to 20 of 23 results

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An Early Detection Circuit for Endurance Enhancement of Backfilled Contact Resistive Random Access Memory Array

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Embedded Micro-detectors for EUV Exposure Control in FinFET CMOS Technology

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Wide range detector of plasma induced charging effect for advanced CMOS BEOL processes

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A Study of the Variability in Contact Resistive Random Access Memory by Stochastic Vacancy Model

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Improved Conductivity of Low‐Temperature‐Synthesized Graphene/Cu for CMOS Backend‐of‐Line Interconnect Applications

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Test Pattern Design for Plasma Induced Damage on Inter-Metal Dielectric in FinFET Cu BEOL Processes

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RTN and Annealing Related to Stress and Temperature in FIND RRAM Array

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Detectors Array for In Situ Electron Beam Imaging by 16-nm FinFET CMOS Technology

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Charge Splitting In Situ Recorder (CSIR) for Real-Time Examination of Plasma Charging Effect in FinFET BEOL Processes

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Correction to: Charge Splitting In Situ Recorder (CSIR) for Real-Time Examination of Plasma Charging Effect in FinFET BEOL Processes

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Design of Versatile Top‐Down Transfer by Thermal Release Tape/Poly(methyl methacrylate) (TRT/PMMA) Bi‐Supporting Layers Toward All‐Transfer Transition Metal Dichalcogenide Material Based Transistor Ar...

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High-density via RRAM cell with multi-level setting by current compliance circuits

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Dynamic pH Sensor with Embedded Calibration Scheme by Advanced CMOS FinFET Technology

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A RRAM Integrated 4T SRAM with Self-Inhibit Resistive Switching Load by Pure CMOS Logic Process

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Retention Model of TaO/HfO x and TaO/AlO x RRAM with Self-Rectifying Switch Characteristics

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A study of hydrogen plasma-induced charging effect in EUV lithography systems

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CMOS compatible 2T pixel for on-wafer in-situ EUV detection

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Retention Model of TaO/HfOx and TaO/AlOx RRAM with Self-Rectifying Switch Characteristics

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Retention Model of TaO/HfO^sub x^ and TaO/AlO^sub x^ RRAM with Self-Rectifying Switch Characteristics

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NATIONAL TSING HUA UNIVERSITY; Patent Issued for Three-Dimensional Integrated Circuit and Method of Transmitting Data within a Three-Dimensional Integrated Circuit (USPTO 9178132)

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